The Stylus Profiler is an important analytical tool in the field of research and industry, used to measure the thickness and surface properties of thin film layers on solid surfaces. The main functions of the Stylus Profiler include:
– Thickness measurement.
– Surface analysis.
– Assessment of surface quality and roughness.
– Examination of mechanical and optical properties.
– Applications in research and product development.
– Measurement Capability: Two-dimensional surface profile measurements
– Sample Viewing : Digital magnification, 0.275 to 2.2 mm vertical FOV
– Stylus Force: 1 to 15 mg with LIS 3 sensor
– Sample X/Y Stage : Manual 100 mm (4 in.) X/Y, manual leveling
– Sample R-Theta Stage : Manual, continuous 360 degrees
– Vibration Isolation
– Data Points Per Scan : 120,000 maximum
– Max. Sample Thickness : 50 mm
– Max. Wafer Size : 200 mm
– Step Height Repeatability: 4Å, 1 sigma on steps ≤1 µm
– Vertical Range : 1 mm
– Vertical Resolution: 1Å
If you have extra question or have some projects having this product, please feel free to reach out to us!
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Dong Da District – Hanoi
(0243) 568-2849
info@vinase.com.vn
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