Multiposition Wafer Probe

Use in resistance measurement applications, such as in the testing and evaluation of electronic components, electronic circuits or materials with resistive properties. This system is commonly used to measure the resistance of components, printed circuit boards, wires, or to test other conductive materials.

  • Model: Multiposition Wafer Probe with RM3000 + Test Unit
  • Manufacture: Jandel Engineering Limited
  • Country: UK

 

Description

  • Input Impedance 1,000,000,000,000 ohms
  • 10nA to 100mA Constant Current Ranges with an guaranteed accuracy of 0.3% across the entire range
  • From -1000mV to +1000mV DVM with a guaranteed accuracy of 0.3% across entire range
  • High resolution DVM mode range from -125mV to +125mV with a guaranteed accuracy of 0.1%
  • Sampling Rate of 8 to 10 Samples per second
  • 24V Compliance Voltage with automatic power limit
  • 16 bit DAC for current source
  • 24 bit ADC for DVM
  • Onboard Memory: 50 time-stamped measurements
  • Current: 10nA – 100mA, reversible to verify contact and measurement
  • Accuracy: Better than 0.1% against resistors for 100nA and greater
  • Connections: USB or RS-232Multiposition Probe Stand:
  • Max. sample size: 150mm wafer
  • Max. sample thickness: Samples up to 4mm thick can be measured
    Four point probe head:
  • Tolerance: +/- 10 microns
  • Needles: Tungsten carbide 0.4mm diameter (0.3mm diameter for close spacing)
  • Retraction to pad: 0.5 mm
  • Planarity: +/- 0.025mm

If you have extra question or have some projects having this product, please feel free to reach out to us!

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